Sample prep room X-ray equipment
Bench-top X-ray Diffractometer
| Model | MiniFlex Ⅱ |
|---|---|
| Manufacturer (Country) | Rigaku/(JPN) |
| Purchase Date | 2005-09-29 |
| Purpose of Use | Identification and quantification of crystalline microstructures |
Product Description and Specifications● A compact benchtop X-ray diffractometer that provides high-quality diffraction data.
● Crystalline microstructures can be checked by simple operation immediately after crystal growth ● KV and mA range: 30KV, 15mA (fixed) ● Goniometer radius: 150mm ● Scanning range: -3° ~ +150° (2θ) ● Scanning speed: 0.01° ~ 100°/min (2θ) ● Slit: RS[0.3mm fixed], DS[θ-axis interlocked variable slit] |
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