Material Analysis Laboratory 3. Crystal Structure Measurement
High Resolution X-ray Diffraction
| Model |
D8 DISCOVER |
| Manufacturer (Country) |
BRUKER |
| Purchase Date |
2013-11-18 |
| Purpose of Use |
Crystal Structure Analysis |
Product Description and Specifications
- High-resolution Geniometer : min. Step size : 0.0001deg
- High power X-Ray Generator (6kW)
- Automatic 4-position Absorber
- 4-bounce Monochromator
- Auto slit assembly for XRR
- Receiving-Monochromator for HR-XRD
- Large 1D detector for RSM
- Easy exchange optic systems
- Parabolic Multi-layer Mirror Divergence : ≤ 0.025°
- Ge 220 Asymmetric
- Parallel slit assembly for GID
- Easy exchange optics systems
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