INSTITUTE OF APPLIED PHYSICS

List

Clean room Cold room Sample prep room Bio-room Material Analysis Laboratory
Material Analysis Laboratory 2. Surface Characterization

Atomic Force Microscope

Model Cypher
Manufacturer (Country) Oxford Instrument
Purchase Date 2013-07-18
Purpose of Use 나노 크기의 원자, 분자 구조물 해석

Product Description and Specifications

  • Head/Optical LeverDeflection Noise <20 pm Bandwidth DC to 7MHz Spot Size 10 x 30 um
  • Scan Range : XY is 30/40um(closed/open loop) Z range is 5/7um(close/open)
  • XYZ sensor noise : XY noise <60pm Z noise <50pm
  • Resolution: Diffraction limited performance(<1um) with apochromatic correction. NA=0.45 Field of view 690 x 920um
  • Based in Igor Pro

  • Scanning Modes : Contact AC Force Dual AC PFM EFM MFM Surface Potential Nanolithography Nanomanipulation Frequency Modulation Operation in fluid Conductive AFM STM Band Excitation
AFM